Download Ebook Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Artech House Integrated Microsystems), by Sudarshan Bahukudumbi, Kris
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Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Artech House Integrated Microsystems), by Sudarshan Bahukudumbi, Kris
Download Ebook Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Artech House Integrated Microsystems), by Sudarshan Bahukudumbi, Kris
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Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.
- Sales Rank: #2715104 in Books
- Brand: Brand: Artech House
- Published on: 2010-02-01
- Original language: English
- Number of items: 1
- Dimensions: 9.10" h x .70" w x 6.20" l, .95 pounds
- Binding: Hardcover
- 198 pages
- Used Book in Good Condition
Most helpful customer reviews
0 of 0 people found the following review helpful.
No real world usefulness
By Jesper
This was obviously written from the view of a disconnected academic with no time in a burn in lab or test floor to understand how to actually get things done. I saw nothing of value here that would actually help engineers.
0 of 0 people found the following review helpful.
Five Stars
By moshirazi
Good product
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